XRF Analyzers for coatings thickness and composition

Hitachi’s range of benchtop XRF analyzers for measuring coatings thickness and composition are designed to meet the challenges of today’s plating shops and electronics components manufacturers. Each instrument contains powerful technology to deliver accurate and precise results yet is durable enough to cope with constant use in a production or laboratory environment.

Whether your challenge is measuring a large variety of shapes and sizes, coping with unusually large substrates, measuring minute features with ultra-thin coatings or simply the volume of analysis you must get done in a day, Hitachi coatings XRF analyzers meet these challenges, helping you to reduce waste, cut rework and ensure the components leaving your facility are of the highest quality. And as coatings get more complex and features even smaller, our range is designed to cope with the challenges of tomorrow, future-proofing your investment.

 

 

 

Applications

PCB / PWB finishing

The ability to control finishing processes determines the pitch, reliability and shelf life of boards. Measure electroless nickel (EN, NiP) plating thickness and composition according to IPC-4556 and IPC-4552B. Hitachi High-Tech Micro XRF products enable you to maintain your operations in tight tolerance to ensure high quality and avoid costly re-work.

Electric and electronic component plating

Components must be plated within specification in order to provide the desired electrical, mechanical and environmental properties. Measure small features or continuous strips using the slotted chamber of the X-Strata series products to control top, intermediate and strike layers for lead frames (leadframes), connector pins, wire and terminations.

IC substrate packages

Semiconductors are becoming increasingly miniaturized and complex, requiring analytical equipment to measure thin films in small areas. Hitachi High-Tech benchtop analyzers are designed to provide high precision analysis and reproducible sample positioning for demanding applications.

Electronic manufacturing services (EMS, ECS)

Combining sourced and locally manufactured components to build a final assembly or product involves many test points, from incoming inspection to at-line process control to final quality control. Our benchtop XRF products allow you to analyze components, solder and finishes throughout the facility, ensuring quality at every step.

Photovoltaics

The demand for renewable energy continues to increase, with photovoltaics playing an important role in harnessing the power of the sun. The ability to collect this energy efficiently is in part determined by the quality of the thin film solar cells. Ensure these cells are plated accurately and consistently with microspot XRF to achieve maximum efficiency.

Restricted materials and high reliability screening

Working with a complex, global supply chain it is critical to trust and verify materials received from suppliers. Use our XRF technology to validate incoming shipments comply with regulations such as RoHS and ELV following IEC 62321 methodology, and ensure high reliability coatings are applied for aerospace and military applications.

 

X-Strata920
Proportional counter

X-Strata920
High resolution SDD

FT110A
Proportional counter

FT230
High resolution SDD

FT160
High resolution SDD
Polycapillary optic

ENIG ★★☆ ★★★ ★★☆ ★★★ ★★★
ENEPIG ★★☆ ★★★ ★★☆ ★★★ ★★★
Electroless nickel thickness and composition (IPC 4556, IPC 4552) N/A ★★☆ N/A ★★☆ ★★★
Electroless nickel thickness ★★☆ ★★★ ★★☆ ★★★ ★★★
Immersion Ag ★★☆ ★★★ ★★☆ ★★★ ★★★
Immersion Sn ★★☆ ★★★ ★★☆ ★★★ ★★★
HASL ★★☆ ★★★ ★★☆ ★★★ ★★★
Pb-free solder (eg. SAC) ★☆☆ ★★☆ ★☆☆ ★★☆ ★★★
CIGS N/A ★★☆ N/A ★★☆ ★★★
CdTe N/A ★★☆ N/A ★★☆ ★★★
Thin film analysis at nm-scale N/A ★★☆ N/A ★★☆ ★★★
Multi-layer analysis ★★☆ ★★★ ★★☆ ★★★ ★★★
IEC 62321 RoHS screening N/A N/A N/A ★★☆ N/A
Measure features < 50 µm N/A N/A N/A N/A ★★★
Pattern recognition software N/A N/A ★★★ N/A ★★★
Elemental mapping N/A N/A N/A N/A N/A

Corrosion resistance

Verify the thickness and chemistry of the applied coatings to ensure product functionality and life-span in harsh environments. Handle small fasteners or large assemblies with ease.

Wear resistance

Prevent product failure by ensuring coating thickness and uniformity of critical components operating in abrasive environments. Complex shapes, thin or thick coatings and finished goods can all be measured.

Decorative finish

When the goal is to achieve a flawless finish, quality control throughout the production process is critical. With our range of test equipment, you can reliably inspect base materials, test intermediate and top layers.

High-temperature resistance

Surface treatments for parts operating in the most extreme conditions must be controlled within tight tolerances. Ensure coatings specifications are met to prevent product recalls and potentially catastrophic failures.

 

X-Strata920
Proportional counter

X-Strata920
High resolution SDD

FT110A
Proportional counter

FT230
Proportional counter

FT160
High resolution SDD

Zn / Fe, Fe alloys
Cr / Fe, Fe alloys
Ni / Fe, Fe alloys
★★☆ ★★★ ★★☆ ★★★ ★★★
ZnNi / Fe, Fe alloys
ZnSn / Fe, Fe alloys
★★☆ ★★★ ★★☆ ★★★ ★★★
NiP / Fe
NiP / Cu
NiP / Al
★★☆
(Thickness only)
★★☆
(Thickness and composition)
★★☆
(Thickness only)
★★☆
(Thickness and composition)
★★★
(Thickness and composition)
Ag / Cu
Sn / Cu 
★★☆ ★★★ ★★☆ ★★★ ★★★
Cr / Ni / Cu / ABS ★★☆ ★★★ ★★☆ ★★★ ★★★
Au / Pd / Ni /CuZn ★★☆ ★★★ ★★☆ ★★★ ★★★
WC / Fe, Fe alloys
TiN / Fe, Fe alloys
★★☆ ★★★ ★★☆ ★★★ ★★★
Thin film analysis at nm-scale N/A ★★☆ N/A ★★☆ ★★★
Multi-layer analysis ★★☆ ★★★ ★★☆ ★★★ ★★★
IEC 62321 RoHS screening N/A N/A N/A ★★☆ N/A
Distance independent measurement N/A N/A ★★★ ★★★ N/A
Pattern recognition software N/A N/A ★★★ N/A N/A

Product Comparison

Hitachi High-Tech Analytical Science X-Strata920

X-Strata920 

The X-Strata920 is a high-precision benchtop XRF analyzer that comes with a huge range of options to accommodate many types of samples. Ideal for measuring coatings on a range of substrates, this analyzer is ideal for electronics, connectors, decorative items and jewelry analysis where product quality must be established.

Hitachi High-Tech Analytical Science FT110A

FT110A

The FT110A is a benchtop XRF analyzer designed to meet the challenges of in-production coatings analysis. Powerful X-ray fluorescence technology coupled with automated positioning functionality helps to increase productivity of plating shops while ensuring components meet the highest standards.

Hitachi High-Tech Analytical Science FT230

FT230

The FT230 is designed to simplify and accelerate testing of components and assemblies making it easier to measure more parts in less time. With features such as Find My Part™ smart recognition, automated sample focusing and a wide view camera, the FT230 reduces set up time and user error to increase throughput and productivity. Let your XRF make decisions for you. 

Hitachi High-Tech Analytical Science FT160

FT160 Series

The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.

  • Proportional counter or high resolution SDD
  • Element range: Ti – U or Al – U (SDD)
  • Chamber design : slotted
  • XY stage options : fixed base, deep well, motorised
  • Largest sample : 270 x 500 x 150 mm
  • Maximum number of collimators : 6
  • Filters : 1
  • Smallest collimator : 0.01 x 0.25 mm (0.5 x10 mil)
  • SmartLink software
Find out more
  • Proportional Counter System
  • Element range : Ti - U
  • Chamber design : closed or slotted
  • XY stage options : fixed base, motorised
  • Largest sample : 500 x 400 x 150 mm
  • Maximum number of collimators : 4
  • Filters: Primary 1, Secondary (Option) 1
  • Smallest collimator : 0.05 mm
  • X-ray Station software
Find out more
  • High resolution SDD 
  • Element range: Al - U 
  • Chamber design: closed or slotted 
  • XY stage options: fixed base, motorized 
  • Largest sample: 500 x 400 x 150 mm 
  • Maximum number of collimators: 4 
  • Filters: 5 primary filters (2x Al, Ti, Mo, Ni) + 1 open position 
  • Smallest collimator: 0.01 x 0.25 mm 
  • FT Connect software 
Find out more
  • High Resolution SDD
  • Element range : Al - U
  • Chamber design : closed
  • XY stage options : motorised, wafer
  • Largest sample : 600 x 600 x 20 mm
  • Filters : 5
  • Polycapillary optic spot size < 30 µm
  • XRF Controller software
Find out more

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