FT160 | Advanced coatings XRF analyzer for electronics
Fast, accurate analysis of nanoscale coatings
The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.
The FT160’s polycapillary optics can measure nm-scale coatings on features smaller than 50 µm, and advanced detector technology gives you high accuracy while maintaining a short measurement time. Other features, such as a large sample table, wide opening door, high-definition sample camera and a substantial observation window, make it easy to load items of varying size and find the region of interest on a large substrate. Easy to use, this analyzer integrates seamlessly with your QA / QC process, alerting you to issues before they become a crisis.
Designed for microspot and ultra-thin coatings analysis, the FT160’s optics and detector technology are optimized for the smallest of features.
Large observation window for viewing analysis from a safe distance
Measurement methods meet standards ISO 3497, ASTM B568 and DIN 50987
Test finishes for IPC-4552B, IPC-4553A, IPC-4554 and IPC-4556 conformity
Automated feature location for fast sample setup
Choice of analyzer configuration optimized for your application
Measure nm-scale coatings on features smaller than 50 µm
Double the analysis throughput of conventional instruments
Accommodates large samples in a wide range of shapes