Benchtop XRF | Coating Thickness Analyzer | FT200 Series

Smart coatings analysis for faster, connected measurement

The FT200 Series benchtop XRF analyzers have been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a series of ground-breaking analyzers that effectively ‘set up’ themselves, making it possible to analyze many more parts within a single shift.

Automation and innovative software are what make the FT230 and FT210 analyzers. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the instrument takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment.

Request pricing or a demo

Product Highlights

Every single element of the FT230 and FT210 has been designed to drastically reduce analysis time.

Automated focusing reduces sample loading time
Find My Part™ smart recognition automatically sets the complete measurement routine
Sample view is presented over a large part of the screen for excellent visibility
Self-checking diagnostics confirms the health and stability of the instrument
Integrates seamlessly with other software and easily exports data

Intuitive and easy to use by non-specialists thanks to a new user interface
Powerful to measure up to four layers at once plus the substrate
Durable for a long-life in a challenging production or lab environment
Conforms to ASTM B568 and DIN ISO 3497
Helps you meet specifications for ENIG (IPC-4552B), ENEPIG (IPC-4556), immersion Sn (IPC-4554) and immersion Ag (IPC-4553A)

	FT210 benchtop XRF analyzer	FT230 benchtop XRF analyzer
Element range	Ti (22) - U (92)	Al (13) - U (92)
Detector	Proportional counter	Silicon drift detector (SDD)
Chamber design	Slotted or closed	Slotted or closed
XY stage design	Motorized or fixed	Motorized or fixed
XY stage travel	250 x 200 mm	250 x 200 mm
Motorized Z-axis travel	205 mm	205 mm
Largest sample size	500 x 400 x 150 mm	500 x 400 x 150 mm
Number of collimators	4	4
Focus laser	Included as standard	Included as standard
Automated focus	Option	Option
Wide-view camera	Option	Option
Distance-independent measurement	Option	Option
Find My Part™ smart recognition	Option	Option
Coatings analysis	✔️	✔️
RoHS screening	n/a	✔️
Software	FT Connect	FT Connect