FT200 Series | Automated XRF for rapid coatings analysis

Smart coatings analysis for faster, connected measurement

The FT200 Series benchtop XRF analyzers have been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a series of ground-breaking analyzers that effectively ‘set up’ themselves, making it possible to analyze many more parts within a single shift.

Automation and innovative software are what make the FT230 and FT210 analyzers. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the instrument takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment.

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Product Highlights

Every single element of the FT230 and FT210 has been designed to drastically reduce analysis time.

  • Automated focusing reduces sample loading time
  • Find My Part™ smart recognition automatically sets the complete measurement routine
  • Sample view is presented over a large part of the screen for excellent visibility
  • Self-checking diagnostics confirms the health and stability of the instrument
  • Integrates seamlessly with other software and easily exports data
  • Intuitive and easy to use by non-specialists thanks to a new user interface
  • Powerful to measure up to four layers at once plus the substrate
  • Durable for a long-life in a challenging production or lab environment
  • Conforms to ASTM B568 and DIN ISO 3497
  • Helps you meet specifications for ENIG (IPC-4552B), ENEPIG (IPC-4556), immersion Sn (IPC-4554) and immersion Ag (IPC-4553A)

FT210 benchtop XRF analyzer

FT230 benchtop XRF analyzer

Element range

Ti (22) - U (92)

Al (13) - U (92)

Detector Proportional counter Silicon drift detector (SDD)
Chamber design Slotted or closed  Slotted or closed
XY stage design

Motorized or fixed 

Motorized or fixed

XY stage travel 250 x 200 mm 250 x 200 mm
Motorized Z-axis travel 205 mm 205 mm
Largest sample size 500 x 400 x 150 mm 500 x 400 x 150 mm
Number of collimators



Focus laser

Included as standard

Included as standard

Automated focus Option Option

Wide-view camera

Option Option

Distance-independent measurement

Option Option

Find My Part™ smart recognition

Option Option

Coatings analysis

✔️ ✔️

RoHS screening

n/a ✔️


FT Connect FT Connect


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