FT230 | Automated XRF for rapid coatings analysis

Simply Smarter

The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up’ itself, making it possible to analyze many more parts within a single shift.

Automation and innovative software are what makes the FT230 analyzer. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the FT230 takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment.

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Product Highlights

Every single element of the FT230 has been designed to drastically reduce analysis time.

  • Automated focusing reduces sample loading time
  • Find My Part™ smart recognition automatically sets the complete measurement routine
  • Sample view is presented over a large part of the screen for excellent visibility
  • Self-checking diagnostics confirms the health and stability of the instrument
  • Integrates seamlessly with other software and easily exports data
  • Intuitive and easy to use by non-specialists thanks to a new user interface
  • Powerful to measure up to four layers at once plus the substrate
  • Durable for a long-life in a challenging production or lab environment
  • Conforms to ASTM B568 and DIN ISO 3497
  • Helps you meet specifications for ENIG (IPC-4552B), ENEPIG (IPC-4556), immersion Sn (IPC-4554) and immersion Ag (IPC-4553A)

FT230 benchtop XRF analyzer

Element range

Al (13) - U (92)

Detector Silicon drift detector (SDD)
Chamber design Slotted or closed
XY stage design

Motorized or fixed

XY stage travel 250 x 200 mm
Motorized Z-axis travel 205 mm
Largest sample size 500 x 400 x 150 mm
Number of collimators


Focus laser

Included as standard

Automated focus Option

Wide-view camera


Distance-independent measurement


Find My Part™ smart recognition


Coatings analysis


RoHS screening



FT Connect


The future of coatings XRF analysis: FT230 launch event

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