The X-Strata920 is a high-precision benchtop XRF analyzer that comes with a huge range of options to accommodate many types of samples. Ideal for measuring coatings on a range of substrates, this analyzer is ideal for electronics, connectors, decorative items and jewelry analysis where product quality must be established.
The strength of the X-Strata920 is its versatility. You can choose from many configurations, including five base configurations to accommodate different sized samples, six collimator sizes for optimal analysis of different sized features, and additional automated features to help speed up the measurement process while maintaining accuracy. Easy to use, with intuitive software, the X-Strata920 can be operated by non-specialists and will slot easily into your production or quality assurance department.
Product Highlights
A range of options and the versatility to accommodate a wide range of samples, the X-Strata920 delivers precise analysis every time.
Adaptable design for reliable analysis of a wide range of products
Automated focusing and optional motorized stage improves accuracy and speed
Intuitive SmartLink software makes taking and exporting measurements easy
Multi-collimator design for utmost accuracy for every sample
Choice of proportional counter or silicon drift detector (SDD) to suit application
Conforms to industry norms, such as IPC-4552A, ISO3497, ASTM B568 and DIN50987
Easy sample loading and fast analysis delivers results in seconds
Powerful optics to analyze single-layer and multi-layer coatings, including alloyed layers
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X-Strata920 benchtop XRF analyzer with proportional counter detector
X-Strata920 benchtop XRF analyzer with silicon drift detector (SDD)
