Benchtop microspot XRF analyzers | FT, EA6000VX and X-Strata ranges

Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds.

Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table.

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PCB / PWB finishing

The ability to control finishing processes determines the pitch, reliability and shelf life of boards. Measure electroless nickel (EN, NiP) plating thickness and composition according to IPC 4556 and IPC 4552A. Hitachi High-Tech products enable you to maintain your operations in tight tolerance to ensure high quality and avoid costly re-work.

Electric and electronic component plating

Components must be plated within specification in order to provide the desired electrical, mechanical and environmental properties. Measure small features or continuous strips using the slotted chamber of the X-Strata series products to control top, intermediate and strike layers for lead frames (leadframes), connector pins, wire and terminations.

IC substrate packages

Semiconductors are becoming increasingly miniaturized and complex, requiring analytical equipment to measure thin films in small areas. Hitachi High-Tech analyzers are designed to provide high precision analysis and reproducible sample positioning for demanding applications.

Electronic manufacturing services (EMS, ECS)

Combining sourced and locally manufactured components to build a final assembly or product involves many test points, from incoming inspection to at-line process control to final quality control. Our microspot XRF products allow you analyze components, solder and finishes throughout the facility, ensuring quality at every step.


The demand for renewable energy continues to increase, with photovoltaics playing an important role in harnessing the power of the sun. The ability to collect this energy efficiently is in part determined by the quality of the thin film solar cells. Ensure these cells are plated accurately and consistently with microspot XRF to achieve maximum efficiency.

Restricted materials and high reliability screening

Working with a complex, global supply chain it is critical to trust and verify materials received from suppliers. Use our XRF technology to validate incoming shipments comply with regulations such as RoHS and ELV following IEC 62321 methodology, and ensure high reliability coatings are applied for aerospace and military applications.


Proportional counter

High resolution SDD

Proportional counter

High resolution SDD

High resolution SDD
Polycapillary optic

ENIG ★★☆ ★★★ ★★☆ ★★★ ★★★
ENEPIG ★★☆ ★★★ ★★☆ ★★★ ★★★
Electroless nickel thickness and composition (IPC 4556, IPC 4552) N/A ★★☆ N/A ★★★ ★★★
Electroless nickel thickness ★★☆ ★★★ ★★☆ ★★★ ★★★
Immersion Ag ★★☆ ★★★ ★★☆ ★★★ ★★★
Immersion Sn ★★☆ ★★★ ★★☆ ★★★ ★★★
HASL ★★☆ ★★★ ★★☆ ★★★ ★★★
Pb-free solder (eg. SAC) ★☆☆ ★★☆ ★☆☆ ★★★ ★★★
CIGS N/A ★★☆ N/A ★★★ ★★★
CdTe N/A ★★☆ N/A ★★★ ★★★
Thin film analysis at nm-scale N/A ★★☆ N/A ★★★ ★★★
Multi-layer analysis ★★☆ ★★★ ★★☆ ★★★ ★★★
IEC 62321 RoHS screening N/A N/A N/A ★★★ N/A
Measure features < 50 µm N/A N/A N/A N/A ★★★
Pattern recognition software N/A N/A ★★★ ★★★ ★★★
Elemental mapping N/A N/A N/A ★★★ N/A

Corrosion resistance

Verify the thickness and chemistry of the applied coatings to ensure product functionality and life-span in harsh environments. Handle small fasteners or large assemblies with ease.

Wear resistance

Prevent product failure by ensuring coating thickness and uniformity of critical components operating in abrasive environments. Complex shapes, thin or thick coatings and finished goods can all be measured.

Decorative finish

When the goal is to achieve a flawless finish, quality control throughout the production process is critical. With our range of test equipment, you can reliably inspect base materials, test intermediate and top layers.

High-temperature resistance

Surface treatments for parts operating in the most extreme conditions must be controlled within tight tolerances. Ensure coatings specifications are met to prevent product recalls and potentially catastrophic failures.


Proportional counter

High resolution SDD

Proportional counter

High resolution SDD

Zn / Fe, Fe alloys
Cr / Fe, Fe alloys
Ni / Fe, Fe alloys
★★☆ ★★★ ★★☆ ★★★
ZnNi / Fe, Fe alloys
ZnSn / Fe, Fe alloys
★★☆ ★★★ ★★☆ ★★★
NiP / Fe
NiP / Cu
NiP / Al
(Thickness only)
(Thickness and composition)
(Thickness only)
(Thickness and composition)
Ag / Cu
Sn / Cu 
★★☆ ★★★ ★★☆ ★★★
Cr / Ni / Cu / ABS ★★☆ ★★★ ★★☆ ★★★
Au / Pd / Ni /CuZn ★★☆ ★★★ ★★☆ ★★★
WC / Fe, Fe alloys
TiN / Fe, Fe alloys
★★☆ ★★★ ★★☆ ★★★
Thin film analysis at nm-scale N/A ★★☆ N/A ★★★
Multi-layer analysis ★★☆ ★★★ ★★☆ ★★★
IEC 62321 RoHS screening N/A N/A N/A N/A
Distance independent measurement N/A N/A ★★★ N/A
Pattern recognition software N/A N/A ★★★ N/A

Product Comparison

  • Proportional counter or high resolution SDD
  • Element range: Ti – U or Al – U (SDD)
  • Chamber design : slotted
  • XY stage options : fixed base, deep well, motorised
  • Largest sample : 270 x 500 x 150 mm
  • Maximum number of collimators : 6
  • Filters : 1
  • Smallest collimator : 0.01 x 0.25 mm (0.5 x10 mil)
  • SmartLink software
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  • Proportional Counter System
  • Element range : Ti - U
  • Chamber design : closed or slotted
  • XY stage options : fixed base, motorised
  • Largest sample : 500 x 400 x 150 mm
  • Maximum number of collimators : 4
  • Filters: Primary 1, Secondary (Option) 1
  • Smallest collimator : 0.05 mm
  • X-ray Station software
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  • High resolution SDD
  • Element range : Mg - U (Na - U when using helium purge)
  • Chamber design : closed
  • XY stage options : motorised
  • Largest sample : 270 x 220 x 150 mm
  • Maximum number of collimators : 4
  • Filters : 6 mode automatic switching
  • Smallest collimator : 0.2mm
  • X-ray Station & Mapping Station software
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FT160 Series
  • High Resolution SDD
  • Element range : Al - U
  • Chamber design : closed
  • XY stage options : motorised, wafer
  • Largest sample : 600 x 600 x 20 mm
  • Filters : 5
  • Polycapillary optic spot size < 30 µm
  • XRF Controller software
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