Benchtop XRF analyzers for RoHS | EA1000AIII, EA1400 and EA6000

Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII, EA1400 and EA6000 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you will be able to meet the requirements for environmental regulations. Choose between two benchtop XRF analyzer ranges; the EA1000 range for dedicated RoHS analysis or the EA6000 for RoHS, coatings and elemental mapping analysis.

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Why choose Hitachi XRF RoHS analyzers?

 

  • Easy to operate
  • Automatic sampling
  • Flexible calibrations to adapt to new RoHS standards
  • Automatically highlights what you’re analyzing for glanceable results
  • Quick measurement
  • Large chamber to fit a variety of samples
  • Visual and audio measurement indicator
  • Option to add coatings and elemental analysis

Product Comparison

EA1000AIII for RoHS analysis
EA1400 for RoHS analysis
EA6000VX for RoHS analysis
EA1000AIII
  • Detector: Si semiconductor detector (No liquid nitrogen required)
  • Measurement time* Cd, Pb, Hg, Br, Cr in plastics: Less than 70 sec
  • Measurement time* Cd, Pb, Hg, Cr in high concentration BrSb plastics : Less than 230 sec
  • Element range: Al (13) to U (92)
  • Sample state: Solid / Powder / Liquid
  • Measurement area: 1 mmφ、3 mmφ、5 mmφ(Electric switching)
  • Sample chamber: W370 x D320 x H120 mm
  • Filter: 5 positions
  • Sample observation: CCD camera full color
  • Operation: Laptop of desktop PC
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EA1400
  • Detector: SDD (No liquid nitrogen required)
  • Measurement time* Cd, Pb, Hg, Br, Cr in plastics: Less than 35 sec
  • Measurement time* Cd, Pb, Hg, Cr in high concentration BrSb plastics: Less than 110 sec
  • Element range: Al (13) to U (92), (Na(11) to U(92) when using Vacuum option) 
  • Sample state: Solid / Powder / Liquid
  • Measurement area: 1 mmφ、3 mmφ、5 mmφ(Electric switching)
  • Sample chamber: W304 x D304 x H110 mm
  • Filter: 5 positions
  • Sample observation: CCD camera full color
  • Operation: Laptop of desktop PC
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EA6000VX
  • High resolution SDD
  • Element range : Mg - U (Na - U when using helium purge)
  • Chamber design : closed
  • XY stage options : motorised
  • Largest sample : 270 x 220 x 150 mm
  • Maximum number of collimators : 4
  • Filters : 6 mode automatic switching
  • Smallest collimator : 0.2mm
  • X-ray Station & Mapping Station software
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*Note: Total measurement time is defined as the time required to reach a statistical error(3 sigma) of 20ppm for Cd, and 100ppm for other elements (measured under Hitachi High-Tech's recommended conditions).

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Application notes