Benchtop XRF analyzers for RoHS | EA1000AIII and EA1400

Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you will be able to meet the requirements for environmental regulations.

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Why choose Hitachi XRF RoHS analyzers?

 

  • Easy to operate
  • Optional 12-position carousel for unattended analysis
  • Flexible calibrations to adapt to new RoHS standards
  • Automatically highlights what you’re analyzing for glanceable results
  • Quick measurement
  • Large chamber to fit a variety of samples
  • Visual and audio measurement indicator
  • Option to add coatings and elemental analysis

Product Comparison

  • Benchtop EDXRF analyzer
  • Rapid RoHS compliance screening (Pb, Hg, Cd, Cr, Br)
  • Typical RoHS screening time: < 70 seconds (for plastics), < 340 seconds (for brass)
  • Automatic selection of calibration for RoHS screening
  • Element range: Al (13) – U(92)
  • Materials analysis: fully qualitative and quantitative analysis using empirical and standardless (FP) calibrations
  • Thin film (coating thickness) analysis (option)
  • Sample type: solids, liquids, powders
  • Detector: Silicon PIN-diode
  • Optimized measurement conditions with 5 programmable filters
  • Analysis atmosphere: Ambient air
  • Analysis area diameter: 1mm, 3mm, 5mm (programmable)
  • Sample observation: color CCD camera
  • Single sample analysis, 12-position sample changer (option)
  • Chamber size: 370(W) × 320(D) × 120(H) mm
  • Data management: data and trend management software to ensure consistent product quality and compliance
  • Operation: Laptop or desktop PC
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  • Benchtop EDXRF analyzer
  • Fast RoHS compliance screening (Pb, Hg, Cd, Cr, Br)
  • Typical RoHS screening time: < 35 seconds (for plastics), < 170 seconds (for brass)
  • Automatic selection of calibration for RoHS screening
  • Element range: Al (13) – U (92), Na (11) – U (92) with vacuum option
  • Materials analysis: fully qualitative and quantitative analysis using empirical and standardless (FP) calibrations
  • Thin film (coating thickness) analysis (option)
  • Sample type: solids, liquids, powders
  • Detector: High resolution silicon-drift detector (SDD) for optimum spectral resolution and results accuracy
  • Optimized measurement conditions with 5 programmable filters
  • Analysis atmosphere: Ambient air, Vacuum for enhanced sensitivity (option)
  • Analysis area diameter: 1mm, 3mm, 5mm (programmable)
  • Sample observation: color CCD camera
  • Single sample analysis, 12-position sample changer (option)
  • Chamber size: 304(W) × 304(D) × 110(H)mm
  • Data management: data and trend management software to ensure consistent product quality and compliance
  • Operation: Laptop or desktop PC
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Brochure

Application notes