Choose from range of high-performance XRF instruments for electroplating thickness analysis of gold (Au), nickel (Ni), silver (Ag), palladium (Pd) and their alloys on a variety of substrates, including copper (Cu) and copper alloys. Confidently measure plating thickness and composition on micro connectors, lead frames, bus bar, interconnects, pins and cable connectors to ensure edge-to-edge uniformity. Ultra-high precision and accuracy makes our range ideal for the intricate connectors produced for communications, memory, automotive electronics, RF/microwave components and 5G devices.
Request Pricing or Demo- Simultaneously measure multiple plating layers, including thickness and composition of alloy plating (including zinc-nickel, tin-zinc) and electroless nickel.
- Automated focusing saves time during measurement setup
- Motorized stage for precision placement of the features of interest
- Image processing software for reproducible positioning, enabling rapid and accurate analysis
- Measure plating bath chemistry to determine composition of main elements in bath so you can make adjustments as needed.
X-Strata920: Flexible fit for samples of any shape
Designed to analyze samples of a wide variety of shapes and sizes, the X-Strata920 is ideal for many applications, including connector surface finishes.
Download brochure X-Strata920 SDD: Flexibility with high resolution detector
The X-Strata920 SDD offers the same flexibility as the X-Strata920, but with a silicon drift detector (SDD) for analyzing complex and thinner coatings.
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FT110A: Powerful XRF for larger components
Designed to accommodate larger samples, this advanced XRF analyzer is easy to use and delivers fast and accurate results with features built for high productivity.
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FT160: Microspot analysis for miniaturized features
Designed for microspot and ultra-thin coatings analysis, the FT160’s polycapillary optics and detector technology are optimized for features less than 50 µm.
Download brochureChoose from two optics configurations: mechanical collimators or polycapillary optics, depending on the size of your connector features and thickness of the coatings you need to analyze.
Collimators:
Ideal for features down to 100 µm, our analyzers with collimators offer multiple size options for optimized precision.
Capillary optics:
For features less than 100 µm and coatings in the nanometer-range, capillary optics are best. For our polycapillary optics XRF instruments, many capillary tubes are clustered together in a tapered configuration. This advanced technology can achieve the smallest spot sizes and direct more X-rays at the board, giving better precision on smaller areas.
| X-Strata920 | X-Strata920 | FT110A | FT160 | |
| Au plating | ★★☆ | ★★★ | ★★☆ | ★★★ |
| Sn plating | ★★☆ | ★★★ | ★★☆ | ★★★ |
| Ag plating | ★★☆ | ★★★ | ★★☆ | ★★★ |
| Pd plating | ★★☆ | ★★★ | ★★☆ | ★★★ |
| Ni plating | ★★☆ | ★★★ | ★★☆ | ★★★ |
| Electroless nickel thickness | ★★☆ | ★★★ | ★★☆ | ★★★ |
| Electroless nickel thickness and composition | N/A | ★★☆ | N/A | ★★★ |
| Thin film analysis at nm-scale | N/A | ★★☆ | N/A | ★★★ |
| Measure features < 50 µm | N/A | N/A | N/A | ★★★ |
| Automated focus | N/A | N/A | ★★★ | ★★★ |
| Wide-view camera | N/A | N/A | ★★★ | N/A |
| Pattern recognition | N/A | N/A | ★★★ | ★★★ |
Our global experts are on hand to help your business find the XRF analyzer for your needs.
