Hitachi’s X-Strata920 fitted with a high-resolution silicon drift detector (SDD) is a high performance, compact, rugged and reliable quality control analyzer for simple, rapid coating thickness and composition analysis. Measurements can be made according to international test methods ISO 3497 and ASTM B568.
The X-Strata920 uses the non-destructive analytical technique of energy dispersive X-ray fluorescence (EDXRF) to generate an X-ray spectrum of the sample. This elemental X-ray spectrum is processed using the supplied Fundamental Parameters (FP) or empirical software to produce coating thickness or composition values. The X-Strata920 comes in a range of chamber and base configurations to accommodate samples of different shapes and sizes.
All chamber configurations are slotted for quick loading of flat or thin samples such as circuit boards and wire. A laser focus ensures reproducible sample placement to get consistent results from any operator. The optional motorized sample stage makes it easy to automatically measure multiple samples or multiple features on a single sample, or perform scans to get a representative analysis on uneven surfaces. Collimators are user-selectable to ensure the best fit and performance on parts of all sizes.