The Control international trade fair for quality assurance is a globally recognized technical event. It explores all pertinent aspects and offers a highly practical presentation of current worldwide offerings for useful technologies, processes, products, and system solutions in the field of industrial quality assurance.
Our experts will display our range of spark spectrometers, handheld XRF and LIBS analyzers and coating thickness analyzer. Arrange a demo and request a free entry voucher by signing up.
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XRF (X-Ray Fluorescence)
XRF, available in both benchtop and handheld formats, is ideal for measuring a wide range of elements and concentrations in many different materials, including metal alloys. XRF technology utilises an X-ray tube to induce a response from the atoms in the tested sample. This technique is ideal when you need low limits of detection for accurate grade separation.
OES is available in mobile and stationary formats. OES can analyse all the key elements at low limits of detection, like phosphorous, sulphur, boron – and carbon, starting with a detection limit of 30ppm. Compared to handheld XRF, OES technique requires more sample preparation and a small but visible burn spot is left on the surface.
LIBS is a fast, handheld format, ideal for the identification of different types of alloys. With a LIBS analyser, there are no X-rays as it uses a focused laser pulse to hit the sample surface, removing a very small amount of material for analysis. This means the LIBS burn mark is so small that it can often be used even for finished goods.
Coating thickness analysis based on XRF is a widely accepted and industry proven analytical technique. Microspot XRF coating thickness analysers for rapid quality control and validation testing. Easy-to-use, fast and non-destructive analysis, needing little to no sample preparation. They are capable of analysing solids or liquids over a wide element range.
