Read the metal. Reveal the quality.

Come to see our complete QA/QC range at Control 2019 Stuttgart, Germany

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Visit us at Control 2019

Stuttgart, 07 – 10 May

Hall 6, Booth 6105



XRF (X-Ray Fluorescence)

XRF, available in both benchtop and handheld formats, is ideal for measuring a wide range of elements and concentrations in many different materials, including metal alloys. XRF technology utilises an X-ray tube to induce a response from the atoms in the tested sample. This technique is ideal when you need low limits of detection for accurate grade separation.

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OES (Optical Emission Spectroscopy)

OES is available in mobile and stationary formats. OES can analyse all the key elements at low limits of detection, like phosphorous, sulphur, boron – and carbon, starting with a detection limit of 30ppm. Compared to handheld XRF, OES technique requires more sample preparation and a small but visible burn spot is left on the surface.

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LIBS (Laser Induced Breakdown Spectroscopy)

LIBS is a fast, handheld format, ideal for the identification of different types of alloys. With a LIBS analyser, there are no X-rays as it uses a focused laser pulse to hit the sample surface, removing a very small amount of material for analysis. This means the LIBS burn mark is so small that it can often be used even for finished goods.

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Benchtop XRF (X-ray Fluorescence)

Coating thickness analysis based on XRF is a widely accepted and industry proven analytical technique. Microspot XRF coating thickness analysers for rapid quality control and validation testing. Easy-to-use, fast and non-destructive analysis, needing little to no sample preparation. They are capable of analysing solids or liquids over a wide element range.

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** For full terms and conditions for free entry for Control 2019 click below.

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